Quality Infrastructure
  • CMM — ZEISS CONTURA

    Our Zeiss Contura CMM can be used for measuring deep features, self-centring, displaced conditions such as reference systems or position errors.

    Customized Programming features for gear parameters and other measurements

  • SIPCON – VMS

    Magnification range from 9X-500X

    Measuring range from 100x100x100mm to 500x400x300mm

    Full 3D software with least count — 1/0.5/0.1 micron

    Fully integration with CAD for reverse engineering application

    Autofocus

    Thread less worktable — Zero Backlash

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